The hottest Ni will host the second design verific

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Ni will host the second "design, verification and testing forum" in April.

National Instruments Co., Ltd. (Ni) announced to host the second "designvalidationtestforum" (dvtf2005). Continuing the success of the first dvtf in 2004, this forum will be held at the Shanghai International Conference Center on April 15, 2005. Ni sincerely invites many excellent enterprises in related fields inside and outside the industry, such as Intel and aeetek, to participate together, providing an excellent learning and exchange platform for engineering and technical personnel in the testing and measurement industry

person in charge of the sponsor, Ms. Zhu Jun, technical marketing manager of Ni China branch, said: "Virtual instrument technology has always been inseparable from the most cutting-edge business technology, providing engineers and scientists with more powerful tools to complete testing, measurement and automation. In the basic principles of accessory design of electronic universal testing machine, Ni and other industry leaders jointly demonstrated the latest technology in this activity, hoping to provide a learning platform to help users solve the challenges in practical applications."

this forum will be divided into hot technology topics and real-time application topics at the same time. More than 10 informative seminars, on-site product displays, and face-to-face exchanges with exhibitors and industry insiders will definitely make your trip worthwhile and definitely an industry event that can't be missed

hot technology topics are customized for software/post experiment hardware engineers in the design, testing and automation industries, as well as professionals who want to learn the development trend of the testing and measurement industry and the latest technology that has formed a research team. Topics include: the latest bus standard - pciexpress, learn how to use this technology to reduce testing time and solve new application problems; Use technology to develop testing and measurement applications; Using the latest NiO technology of LabVIEW and FPGA, you can customize the measurement hardware circuit, etc. The real-time application topic aims to build a robust, reliable and deterministic measurement, control and automatic. What is the distance between the markings? In this forum, you will learn about the real-time platform provided by Ni and other industry experts for measurement and control systems

for many years, relying on its flagship product LabVIEW graphical development environment and a full range of modular hardware, Ni has improved production efficiency and reduced costs for users around the world. The technology forum held by Ni China in conjunction with other industry leaders is also to better serve local users and provide maximum support

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